[IEEE 2009 IEEE MTT-S International Microwave Symposium Digest (MTT) - Boston, MA, USA (2009.06.7-2009.06.12)] 2009 IEEE MTT-S International Microwave Symposium Digest - Extension of X-parameters to include long-term dynamic memory effects
Verspecht, Jan, Horn, Jason, Betts, Loren, Gunyan, Daniel, Pollard, Roger, Gillease, Chad, Root, David E.Year:
2009
Language:
english
DOI:
10.1109/mwsym.2009.5165803
File:
PDF, 523 KB
english, 2009