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[IEEE 1999 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (18-21 Oct. 1999)] 1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460) - Detecting breakdown in ultra-thin dielectrics using a fast voltage ramp
Snyder, E.S., Suehle, J.Year:
1999
Language:
english
DOI:
10.1109/irws.1999.830571
File:
PDF, 526 KB
english, 1999