[IEEE 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - Mumbai, India (2010.12.14-2010.12.16)] 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - Compressible flow behaviour through wavy channels
Ravi, K, Gupta, S K, Sharma, Atul, Iyer, KannanYear:
2010
Language:
english
DOI:
10.1109/icresh.2010.5779562
File:
PDF, 1.38 MB
english, 2010