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Reducing Contact Resistance Using Compliant Nickel Nanowire Arrays
Baek, Stanley S., Fearing, Ronald S.Volume:
31
Language:
english
Journal:
IEEE Transactions on Components and Packaging Technologies
DOI:
10.1109/tcapt.2008.2004576
Date:
December, 2008
File:
PDF, 2.11 MB
english, 2008