[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (April 17-21, 2005)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - Universality of power-law voltage dependence for TDDB lifetime in thin gate oxide PMOSFETs
Ohgata, K., Ogasawara, M., Shiga, K., Tsujikawa, S., Murakami, E., Kato, H., Umeda, H., Kubota, K.Year:
2005
Language:
english
DOI:
10.1109/relphy.2005.1493115
File:
PDF, 806 KB
english, 2005