![](/img/cover-not-exists.png)
[IEEE Comput. Soc 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Monterey, CA, USA (3-5 Oct. 2005)] 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05) - Test of interconnection opens considering coupling signals
Gomez, R., Giron, A., Champac, V.Year:
2005
Language:
english
DOI:
10.1109/dftvs.2005.64
File:
PDF, 291 KB
english, 2005