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[IEEE Comput. Soc 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Monterey, CA, USA (3-5 Oct. 2005)] 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05) - Test of interconnection opens considering coupling signals

Gomez, R., Giron, A., Champac, V.
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Year:
2005
Language:
english
DOI:
10.1109/dftvs.2005.64
File:
PDF, 291 KB
english, 2005
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