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[IEEE 28th Annual Conference of the IEEE Industrial Electronics Society - Sevilla, Spain (5-8 Nov. 2002)] IEEE 2002 28th Annual Conference of the Industrial Electronics Society. IECON 02 - Coarse resolution defect localization algorithm for an automated visual printed circuit board inspection
Ibrahim, Z., Aspar, Z., Al-Attas, S.A.R., Mokji, M.M.Year:
2002
Language:
english
DOI:
10.1109/iecon.2002.1182808
File:
PDF, 339 KB
english, 2002