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[IEEE 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Chicago, Illinois, USA (2009.10.7-2009.10.9)] 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - An ILP formulation to Unify Power Efficiency and Fault Detection at Register-Transfer Level
Liu, Yu, Wu, KaijieYear:
2009
Language:
english
DOI:
10.1109/dft.2009.19
File:
PDF, 370 KB
english, 2009