[IEEE International Conference on Microelectronic Test Structures - Nara, Japan (22-25 March 1995)] Proceedings International Conference on Microelectronic Test Structures - Accurate capacitor matching measurements using floating gate test structures
Tuinhout, H.P., Elzinga, H., Brugman, J.T., Postma, F.Year:
1995
Language:
english
DOI:
10.1109/icmts.1995.513960
File:
PDF, 666 KB
english, 1995