[IEEE International Conference on Electrical, Electronic and Computer Engineering, 2004. ICEEC '04. - Cairo, Egypt (5-7 Sept. 2004)] International Conference on Electrical, Electronic and Computer Engineering, 2004. ICEEC '04. - Flash memory testing for realistic fault modeling ICEEC2004
Keshk, A.Year:
2004
Language:
english
DOI:
10.1109/iceec.2004.1374512
File:
PDF, 297 KB
english, 2004