Analytical Solutions of the Frequency Shifts of Several Modes in Dynamic Force Microscopy Subjected to AC Electrostatic Force
Lin, Shueei-MuhVolume:
6
Language:
english
Journal:
IEEE Transactions On Nanotechnology
DOI:
10.1109/tnano.2007.900497
Date:
July, 2007
File:
PDF, 374 KB
english, 2007