Incident Angle Dependence of Residual Defect in Silicon...

Journal of Nuclear Science and Technology 1991 / 06 Vol. 28; Iss. 6

Incident Angle Dependence of Residual Defect in Silicon Surface Barrier Detector

KANNO, Ikuo, IKEZOE, Hiroshi, OHTSUKI, Tsutomu, HAYASHI, Shu A., KANAZAWA, Satoshi, KIMURA, Itsuro
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Volume:
28
Language:
english
Journal:
Journal of Nuclear Science and Technology
DOI:
10.1080/18811248.1991.9731397
Date:
June, 1991
File:
PDF, 182 KB
english, 1991
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