[IEEE International Electron Devices Meeting. Technical...

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[IEEE International Electron Devices Meeting. Technical Digest. IEDM - San Francisco, CA, USA (10-13 Dec. 2000)] International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) - Resolving the non-uniqueness of the activation energy associated with TDDB for SiO/sub 2/ thin films

Shanware, A., Khamankar, R.B., McPherson, W.
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Year:
2000
Language:
english
DOI:
10.1109/iedm.2000.904378
File:
PDF, 343 KB
english, 2000
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