[IEEE Proceedings of the IEEE 2006 International Interconnect Technology Conference - Burlingame, CA (2006.06.5-2006.06.7)] 2006 International Interconnect Technology Conference - Electron Scattering in Narrow Metal Wires
Galla, D., Purswani, J.M., Timochevski, V., Ke, Y., Guo, H.Year:
2006
Language:
english
DOI:
10.1109/iitc.2006.1648645
File:
PDF, 900 KB
english, 2006