Dynamic Infrared Lifetime Mapping for the Measurement of...

IEEE Journal of Photovoltaics 2014 / 03 Vol. 4; Iss. 2

Dynamic Infrared Lifetime Mapping for the Measurement of the Saturation Current Density of Highly Doped Regions in Silicon

Muller, Jens, Hannebauer, Helge, Mader, Christoph, Haase, Felix, Bothe, Karsten
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Volume:
4
Language:
english
Journal:
IEEE Journal of Photovoltaics
DOI:
10.1109/jphotov.2013.2293062
Date:
March, 2014
File:
PDF, 687 KB
english, 2014
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