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[IEEE 2012 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Bangkok, Thailand (2012.12.3-2012.12.5)] 2012 IEEE International Conference on Electron Devices and Solid State Circuit (EDSSC) - Modeling hot-carrier-induced reliability of poly-silicon thin film transistors
Wang, Lisa L., Kuo, J. B., Shengdong Zhang,Year:
2012
Language:
english
DOI:
10.1109/edssc.2012.6482798
File:
PDF, 127 KB
english, 2012