[IEEE 2005 Joint 30th International Conference on Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics - Herndon, VA, USA (25-28 Sept. 2005)] 2005 Joint 30th International Conference on Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics - Hybrid test data compression technique for SOC scan testing

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