[IEEE 2008 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Hong Kong, China (2008.12.8-2008.12.10)] 2008 IEEE International Conference on Electron Devices and Solid-State Circuits - Power efficient charge pump circuit in standard twin-well CMOS technology
Jung-Chan Lee,, Jin-Young Park,, Yeonbae Chung,Year:
2008
Language:
english
DOI:
10.1109/edssc.2008.4760639
File:
PDF, 560 KB
english, 2008