Memory-State Dependence of Random Telegraph Noise of $ \hbox{Ta}_{2}\hbox{O}_{5}/\hbox{TiO}_{2}$ Stack ReRAM
Terai, Masayuki, Sakotsubo, Yukihiro, Saito, Yukihiro, Kotsuji, Setsu, Hada, HiromitsuLanguage:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2010.2068033
Date:
November, 2010
File:
PDF, 358 KB
english, 2010