[IEEE 2014 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) - Columbus, OH, USA (2014.6.23-2014.6.28)] 2014 IEEE Conference on Computer Vision and Pattern Recognition - Patch-Based Evaluation of Image Segmentation
Ledig, Christian, Shi, Wenzhe, Bai, Wenjia, Rueckert, DanielYear:
2014
Language:
english
DOI:
10.1109/cvpr.2014.392
File:
PDF, 628 KB
english, 2014