[IEEE 2005 IEEE International Conference on Industrial Technology - Hong Kong (14-17 Dec. 2005)] 2005 IEEE International Conference on Industrial Technology - Study of Fault Diagnosis Approach Based on Rules of Deep Knowledge Representation of Signed Directed Graph
Wen-liang Cao,, Bing-shu Wang,, Liang-yu Ma,, Qin Yan,, Wei Hao,, Yufeng Xin,Year:
2005
Language:
english
DOI:
10.1109/icit.2005.1600741
File:
PDF, 810 KB
english, 2005