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[IEEE 1999 Symposium on High Performance Electron Devices for Microwave and Optoelectronic Applications. EDMO - London, UK (22-23 Nov. 1999)] 1999 Symposium on High Performance Electron Devices for Microwave and Optoelectronic Applications. EDMO (Cat. No.99TH8401) - On wafer intermodulation distortion measurements on resistive FET mixers for device comparison and model validation
Hutabarat, M.T., Webster, D.R., Haigh, D.G., Schreurs, D., van der Zanden, K., Edgar, D.L., Borsosfoldi, Z., Elgaid, K., Thayne, I.G., Parker, A.E.Year:
1999
Language:
english
DOI:
10.1109/edmo.1999.821480
File:
PDF, 494 KB
english, 1999