[IEEE 2008 IEEE Compound Semiconductor Integrated Circuits Symposium (CSICS) - Monterey, CA, USA (2008.10.12-2008.10.15)] 2008 IEEE Compound Semiconductor Integrated Circuits Symposium - GaAs HBT Reliability
Yeats, B., Low, T. S., Alt, K., Adamski, M. E., Bonse, M., D'Avanzo, D. C., Dvorak, M., Hutchinson, C. P., Iwamoto, M., Kellert, F. G., Kuhn, D. K., Shimon, R. L., Shirley, T. E.Year:
2008
Language:
english
DOI:
10.1109/csics.2008.14
File:
PDF, 668 KB
english, 2008