A new integrated test structure for on-chip post-irradiation annealing in MOS devices
Chabrerie, C., Autran, J.L., Flamente, O., Boudenot, J.C.Volume:
45
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.685220
Date:
June, 1998
File:
PDF, 803 KB
english, 1998