[IEEE 2006 IEEE Instrumentation and Measurement Technology...

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[IEEE 2006 IEEE Instrumentation and Measurement Technology - Sorrento, Italy (2006.04.24-2006.04.27)] 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings - A Time Domain Envelope Vectorial Network Analyzer for Non-linear Measurement Based Modeling Accounting Impedance Mismatches

Reveyrand, T., Soury, A., Macraigne, F., Nanfack, G., Barataud, D., Nebus, J-M., Ngoya, E.
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Year:
2006
Language:
english
DOI:
10.1109/imtc.2006.328383
File:
PDF, 173 KB
english, 2006
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