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[IEEE 2007 IEEE 20th International Vacuum Nanoelectronics Conference - Chicago, IL, USA (2007.07.8-2007.07.12)] 2007 IEEE 20th International Vacuum Nanoelectronics Conference - Measurements and analysis of advanced field emission cold cathodes
He, X., Scharer, J., Booske, J., Vlahos, V., Sengele, S., Jordan, N., Gilgenbach, R., Feng, Y., Verboncoeur, J.Year:
2007
Language:
english
DOI:
10.1109/ivnc.2007.4480922
File:
PDF, 221 KB
english, 2007