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[IEEE 2010 20th International Conference on Electronics Communications and Computers (CONIELECOMP) - Cholula, Puebla, Mexico (2010.02.22-2010.02.24)] 2010 20th International Conference on Electronics Communications and Computers (CONIELECOMP) - Development of an ultrasonic thickness measurement equipment prototype
Luciano, Nava-Balanzar, Alberto, Soto-Cajiga Jorge, Carlos, Pedraza-Ortega Jesus, Manuel, Ramos-Arreguin JuanYear:
2010
Language:
english
DOI:
10.1109/conielecomp.2010.5440783
File:
PDF, 767 KB
english, 2010