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[IEEE 2006 IEEE Autotestcon - Anaheim, CA, USA (2006.09.18-2006.09.21)] 2006 IEEE Autotestcon - Prognostics for Electronic Systems
Droste, David, Finklea, KenYear:
2006
Language:
english
DOI:
10.1109/autest.2006.283623
File:
PDF, 5.74 MB
english, 2006