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[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - An update on IEEE 1149.6 - successes and issues
Eklow, B.Year:
2005
Language:
english
DOI:
10.1109/test.2005.1584014
File:
PDF, 336 KB
english, 2005