[IEEE 2010 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2010) - Bologna, Italy (2010.09.6-2010.09.8)] 2010 International Conference on Simulation of Semiconductor Processes and Devices - Microscopic simulation of electron transport and self-heating effects in InAs Nanowire MISFETs
Sadi, Toufik, Thobel, Jean-Luc, Dessenne, FrancoisYear:
2010
Language:
english
DOI:
10.1109/sispad.2010.5604558
File:
PDF, 136 KB
english, 2010