![](/img/cover-not-exists.png)
[IEEE 2011 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Hangzhou, China (2011.05.10-2011.05.12)] 2011 IEEE International Instrumentation and Measurement Technology Conference - Transient conditions and overlapping sub-records: An excellent pair for FRF measurements
Barbe, Kurt, Vanbeylen, Laurent, Van Moer, WendyYear:
2011
Language:
english
DOI:
10.1109/imtc.2011.5944048
File:
PDF, 289 KB
english, 2011