[IEEE 2009 IEEE International Workshop on Memory...

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[IEEE 2009 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT) - Hsinchu, Taiwan (2009.08.31-2009.09.2)] 2009 IEEE International Workshop on Memory Technology, Design, and Testing - 3-D Content Addressable Memory Architectures

Hu, Yong-Jyun, Li, Jin-Fu, Huang, Yu-Jen
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Year:
2009
Language:
english
DOI:
10.1109/mtdt.2009.20
File:
PDF, 172 KB
english, 2009
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