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[IEEE 2008 19th International Conference on Pattern Recognition (ICPR) - Tampa, FL, USA (2008.12.8-2008.12.11)] 2008 19th International Conference on Pattern Recognition - π-SIFT: A photometric and Scale Invariant Feature Transform
Park, Jae-Han, Park, Kyung-Wook, Seung-Ho Baeg,, Moon-Hong Baeg,Year:
2008
Language:
english
DOI:
10.1109/icpr.2008.4761181
File:
PDF, 1.04 MB
english, 2008