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[IEEE 2011 International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Tianjin, China (2011.11.17-2011.11.18)] 2011 IEEE International Conference of Electron Devices and Solid-State Circuits - Design of a hysteresis lock detector for dual-loops clock and data recovery circuit
Tan, Yung Sern, Yeo, Kiat Seng, Boon, Chirn Chye, Do, Manh AnhYear:
2011
Language:
english
DOI:
10.1109/edssc.2011.6117638
File:
PDF, 270 KB
english, 2011