[IEEE 2008 Design, Automation and Test in Europe - Munich,...

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[IEEE 2008 Design, Automation and Test in Europe - Munich, Germany (2008.03.10-2008.03.14)] 2008 Design, Automation and Test in Europe - From Transistor to PLL - Analogue Design and EDA Methods

Binkley, David M, Binkley, David M, Graeb, Helmut, Gielen, Georges G E, Roychowdhury, Jaijeet
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Year:
2008
Language:
english
DOI:
10.1109/date.2008.4484643
File:
PDF, 80 KB
english, 2008
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