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[IEEE IEEE International Digest on Microwave Symposium - Dallas, TX, USA (8-10 May 1990)] IEEE International Digest on Microwave Symposium - Characterization of GaAs devices by a versatile pulsed I-V measurement system
Platzker, A., Palevsky, A., Nash, S., Struble, W., Tajima, Y.Year:
1990
DOI:
10.1109/MWSYM.1990.99780
File:
PDF, 292 KB
1990