[IEEE 2008 66th Annual Device Research Conference (DRC) -...

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[IEEE 2008 66th Annual Device Research Conference (DRC) - Santa Barbara, CA, USA (2008.06.23-2008.06.25)] 2008 Device Research Conference - Structural Sensitivity of Interband Tunnel Diodes for SRAM

Sutar, Surajit, Zhang, Qin, Seabaugh, Alan
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Year:
2008
Language:
english
DOI:
10.1109/drc.2008.4800736
File:
PDF, 1.04 MB
english, 2008
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