An Experimental Low-Cost, Low-Data-Rate Rapid Structural Assessment Network
Jren-Chit Chin,, Rautenberg, J.M., Ma, C.Y.T., Pujol, S., Yau, D.K.Y.Volume:
9
Language:
english
Journal:
IEEE Sensors Journal
DOI:
10.1109/jsen.2009.2019355
Date:
November, 2009
File:
PDF, 1.02 MB
english, 2009