[IRE 1973 International Electron Devices Meeting - ()] 1973 International Electron Devices Meeting - The drain-source protected MNOS memory device and memory endurance
Cricchi, J.R., Blaha, F.C., Fitzpatrick, M.D.Year:
1973
Language:
english
DOI:
10.1109/iedm.1973.188665
File:
PDF, 223 KB
english, 1973