[IEEE 2004 Conference on Precision Electromagnetic...

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[IEEE 2004 Conference on Precision Electromagnetic Measurements - London, UK (2004.06.27-2004.07.2)] 2004 Conference on Precision Electromagnetic Measurements - With an Intense Bismuth ION Beam Toward Accumulation of a Weighable Mass ofAtoms

Schlegel, Ch., Ratschko, D., Scholz, F., Glaser, M.
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Year:
2004
Language:
english
DOI:
10.1109/cpem.2004.305505
File:
PDF, 194 KB
english, 2004
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