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Basic study of fitting method for base curve extraction in lightning impulse test techniques
Okabe, Shigemitsu, Tsuboi, Toshihiro, Ueta, Genyou, Takami, Jun, Hirose, HideoVolume:
17
Language:
english
Journal:
IEEE Transactions on Dielectrics and Electrical Insulation
DOI:
10.1109/tdei.2010.5411995
Date:
February, 2010
File:
PDF, 639 KB
english, 2010