![](/img/cover-not-exists.png)
[IEEE 2008 32nd Annual IEEE International Computer Software and Applications Conference - Turku, Finland (2008.07.28-2008.08.1)] 2008 32nd Annual IEEE International Computer Software and Applications Conference - Two-Level Variability Analysis for Business Process with Reusability and Extensibility
Moon, Mikyeong, Hong, Minwoo, Yeom, KeunhyukYear:
2008
Language:
english
DOI:
10.1109/compsac.2008.129
File:
PDF, 273 KB
english, 2008