Optimum Bias Load-Line Compensates Temperature Variation of Junction Diode's RF Resistance
Bera, Subhash Chandra, Singh, Raj Vir, Garg, Vinesh Kumar, Sharma, Sashi BhushanVolume:
55
Language:
english
Journal:
IEEE Transactions on Microwave Theory and Techniques
DOI:
10.1109/tmtt.2006.889155
Date:
February, 2007
File:
PDF, 560 KB
english, 2007