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[IEEE IEEE 1998 National Aerospace and Electronics Conference NAECON 1998. Celebrating 50 Years - Dayton, OH, USA (13-17 July 1998)] Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185) - Characterization of two color mid-infrared measurements
Montgomery, J.B., Sanderson, R.B., Clinton, B.L., Baxley, F.O.Year:
1998
Language:
english
DOI:
10.1109/naecon.1998.710128
File:
PDF, 938 KB
english, 1998