NMOSFET ESD self-protection strategy and underlying failure...

IEEE Transactions on Device and Materials Reliability 2002 / 03 Vol. 2; Iss. 1

NMOSFET ESD self-protection strategy and underlying failure mechanism in advanced 0.13-μm CMOS technology

Salman, A., Gauthier, R., Stadler, W., Esmark, K., Muhammad, M., Putnam, C., Ioannou, D.E.
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Volume:
2
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2002.1014666
Date:
March, 2002
File:
PDF, 301 KB
english, 2002
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