Characterization of technetium radiopharmaceuticals by thin-layer spectroelectrochemistry
Jon R. Kirchhoff, Edward Deutsch, William R. HeinemanVolume:
4
Year:
1986
Language:
english
Pages:
11
DOI:
10.1016/0731-7085(86)80088-7
File:
PDF, 830 KB
english, 1986