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[IEEE 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2013.11.18-2013.11.21)] 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Sensitization criterion for threshold logic circuits and its application
Tsai, Chen-Kuan, Wang, Chun-Yao, Huang, Ching-Yi, Chen, Yung-ChihYear:
2013
Language:
english
DOI:
10.1109/iccad.2013.6691123
File:
PDF, 723 KB
english, 2013