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[IEEE 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Brugge, Belgium (2009.09.14-2009.09.18)] 2009 European Conference on Radiation and Its Effects on Components and Systems - Bias effects on total dose-induced degradation of bipolar linear microcircuits for switched dose-rate irradiation
Velo, Y. Gonzalez, Boch, J., Roche, N. J-H., Perez, S., Vaille, J-R., Dusseau, L., Saigne, F., Lorfevre, E., Schrimpf, R. D., Chatry, C., Canals, A.Year:
2009
Language:
english
DOI:
10.1109/radecs.2009.5994665
File:
PDF, 529 KB
english, 2009