Package Stress Monitor to Compensate for the Piezo-Hall...

IEEE Sensors Journal 2013 / 08 Vol. 13; Iss. 8

Package Stress Monitor to Compensate for the Piezo-Hall Effect in CMOS Hall Sensors

Huber, Samuel, Schott, Christian, Paul, Oliver
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Volume:
13
Language:
english
Journal:
IEEE Sensors Journal
DOI:
10.1109/jsen.2013.2264805
Date:
August, 2013
File:
PDF, 2.07 MB
english, 2013
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