[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Reliability assessment in different HTO test conditions of AlGaN/GaN HEMTs
Malbert, N., Labat, N., Curutchet, A., Sury, C., Hoel, V., de Jaeger, J.-C., Defrance, N., Douvry, Y., Dua, C., Oualli, M., Piazza, M., Bru-Chevallier, C., Bluet, J.-M., Chikhaoui, W.Year:
2010
Language:
english
DOI:
10.1109/irps.2010.5488839
File:
PDF, 449 KB
english, 2010